CDPH Lead Inspector/Assessor California State Practice Exam

When is substrate correction typically not required?

1. For all substrate types

2. When using a specific type of XRF instrument

3. For materials that do not interfere with readings

4. For every reading taken

The correct answer is: When using a specific type of XRF instrument

Substrate correction is typically not required when using a specific type of XRF instrument designed to minimize interference from the substrate material. Certain XRF (X-ray fluorescence) devices are engineered to provide accurate lead readings regardless of the substrate, allowing for more straightforward analysis without the need for additional corrections. This design attribute enhances the device's usability in various environments, making it an effective tool for lead inspection and assessment. The function of these specialized instruments is crucial in circumstances where different substrates could otherwise distort the readings, thus facilitating more reliable and efficient testing procedures.